Optech Announces New Profile Scanning Feature

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Optech Announces New Profile Scanning Feature

Post by Phil Marsh »

Optech Announces New Profile Scanning Feature for the ILRIS-36D Scanner

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Toronto, Canada – Optech Incorporated, a provider of advanced lidar survey instruments, announced today a new Profile Scanning feature to be implemented with its ILRIS-36Dscanner.

Profile Scanning will significantly reduce scanning time and decrease operator post processing time, especially for building interiors and extremely large infrastructure projects. By automatically controlling the rotational speed of the pan and tilt base, and operating the vertical scanning action of the ILRIS, Profile Scanning performs a complete or selected portion of a continuous 360o area scan. The rotational speed is automatically monitored. The spot spacing or step size selection automatically determines the rotational speed of the base; the speed can also be manually selected to enable the operator to specify a required speed.

Profile Scanning reduces scanning time because scans are no longer required to overlap for alignment. Post processing time is reduced because there is no longer a requirement to align individual scans.Software alignment is still available when scenes are scanned from multiple scanner set-up positions.

“With Optech’s sustained commitment to product improvement, Profile Scanning will improve overall workflow efficiency and post processing throughput without any additional cost to the user,” said Brent Gelhar, Vice President Sales and Product Strategy.

This feature will be available with all new deliveries of the ILRIS-36D scanner system.
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